IC10單晶高溫合金葉片熒光滲透檢測的缺陷顯示

IC10單晶高溫合金葉片熒光滲透檢測的缺陷顯示The Defect Indication of Fluorescent Penetrating Inspection for IC10 Single Crystal Super Alloy Blade

對IC10單晶高溫合金導向葉片熒光滲透檢測的缺陷熒光顯示進行了分析，確定了缺陷性質主要為顯微疏松缺陷；通過對比試驗獲取了航空發動機渦輪葉片常用的滲透檢測靈敏度等級和方法的特點和區別。試驗結果表明：采用后乳化熒光滲透檢測法對IC10單晶高溫合金導向葉片缺陷的檢出更為合適。

The defects indications are analysed for IC10 single crystal blades inspected by FPI method. The defects indications are mainly microporosity defects, the FPI sensitivity class and the character and difference of method are got by FPI contrast testing. It is indicated that the Post emulsification fluorescence penetrant inspecting method is fit for defect inspection.

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